Impact Assessment about UV- and AO-Irradiated Silicone Contaminants through Optical Property Measurement

DOI:10.15011//jasma.33.330408
Int. J. Microgravity Sci. Appl. 2016p330408
Author
R. YAMANAKA, K. MORI, E. MIYAZAKI, T. YAMAGUCHI and O. ODAWARA
Organization
Research and Development Directorate/ Human Spaceflight Technology Directorate, Japan Aerospace Exploration Agency, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology.Tokyo Institute of Technology
Abstract
In order to clarify the influences of atomic oxygen (AO) or the interaction between ultraviolet rays (UV) and AO to optical properties of silicone contaminants, UV- and AO-irradiated silicone contaminants were evaluated through optical property measurement. RTV-S691, a silicone adhesive with low volatiles content and minimum outgassing behavior for space utilizations, was used as an outgassing source, and two optical materials (magnesium fluoride and zinc selenide) were used for collecting contaminants from the RTV-S691. Optical properties were examined by Fourier transform infrared spectroscopy and Ultraviolet-visible-near infrared spectroscopy. RTV-S691 was heated to 125°C, while the two optical materials used for collecting contaminants were maintained at 25°C. The results show that UV- and AO-irradiation have impacted the optical properties of silicone contaminants, for example, some optical spectral peaks were disappeared by AO irradiation.
Keyword(s)
Silicone contaminants, Ultraviolet rays, Atomic oxygen, Optical property.
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Received 27 May 2016, Accepted 6 September 2016, Published 31 October 2016

© The Japan Society of Microgravity Applicaiton

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